LED and Luminaire Failure Analysis
Typical applications:
Root Cause Failure Analysis
Technology Evaluation
Supplier Qualification
Quality Documentation
Non-conformance Verification
Reliability Qualification to LM-79 and LM-80
Technology Cloning
Destructive Physical Analysis (DPA)
Intellectual Property Violation
Counterfeit Detection
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Emission spectrum of Daylight light bulb
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Patchiness in light emission
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18-in sphere for photometric measurements
18-in sphere for photometric measurements
Equipment:
MuAnalysis offers a wide range of sophisticated analytical techniques for examining materials and devices, including:
Acoustic Microscopy
X-Ray Imaging
Electron Microscopy with EDX
X-Ray Fluorescence Spectroscopy
Raman Micro-Spectroscopy
FTIR Micro-Spectroscopy
UV Fluorescence Microscopy
Confocal Laser Scanning Microscopy
Environmental Chamber Stressing
and more…