Teardown Reports

A19 LED bulbs teardown Feit, GE, Pharox, Philips, Sylvania(1)
Cree-CGH40010-GaN-HEMT-Teardown-Report-short-version
Cree-XLAMP-LED Lamp-Teardown-Report
EPC-GaN-MOSFET-Teardown-report-short version
Infineon-G1-and-G2-vs-Cree-6A-and-ST-10A-SiC-Schottky
Lumileds-Luxeon-K2-LED-Lamp-Teardown-Report-short-version
Lumileds-Luxeon-Rebel-LED-Lamp-Teardown-Report-short-version
Nichia-Jupiter-LED-Lamp-Teardown-Report-short-version
Nitronex-NPT35015-GaN-HEMT-Teardown-Report-short-version
Nitronex-NPTB0004-GaN-HEMT-Teardown-Report-short-version
Osram-Dragon-LED-Lamp-Teardown-Report-short-version
Seoul-Semiconductor-Z-Power-LED-P9-series
XYZ LED inside view

Papers & Presentations

MuAnalysis Newsletter June 2020
MuAnalysis Newsletter January 2020
Video: Recognizing wirebond failures
Video: Recognizing solderability failures
MuAnalysis Newsletter September 2019
Confocal Laser Scanning Microscopy - A Tool for Counterfeit Detection
Estimating the Lifetime of Electrolytic Capacitors
Blackpad Revisited Paper
Aftermarket Electronic Devices
Counterfeit-or-Retrofit
Dynamic-Electroluminescence-Imaging-applied-to-an-OTP
Printed-Circuit-Board-Reliability-Integrity-Characterization
Quantum-Wells-in-Seasonal-Department-Christmas-Lights-LED
Graphene Based Ink Coated Fabrics for Wearable Electronics Analysis
Dynamic-Electroluminescence-Imaging-as-Optical Oscilloscope-Probe