Teardown Reports
Cree-CGH40010-GaN-HEMT-Teardown-Report-short-version
Cree-XLAMP-LED Lamp-Teardown-Report
EPC-GaN-MOSFET-Teardown-report-short version
Infineon-G1-and-G2-vs-Cree-6A-and-ST-10A-SiC-Schottky
Lumileds-Luxeon-K2-LED-Lamp-Teardown-Report-short-version
Lumileds-Luxeon-Rebel-LED-Lamp-Teardown-Report-short-version
Nichia-Jupiter-LED-Lamp-Teardown-Report-short-version
Nitronex-NPT35015-GaN-HEMT-Teardown-Report-short-version
Nitronex-NPTB0004-GaN-HEMT-Teardown-Report-short-version
Osram-Dragon-LED-Lamp-Teardown-Report-short-version
Seoul-Semiconductor-Z-Power-LED-P9-series
XYZ LED inside view
Papers & Presentations
MuAnalysis Newsletter September 2024
MuAnalysis Newsletter Spring 2024
MuAnalysis Newsletter September 2023
MuAnalysis Newsletter January 2023
MuAnalysis Newsletter November 2022
MuAnalysis Newsletter May 2022
MuAnalysis Newsletter Fall 2021
MuAnalysis Newsletter Summer 2021
MuAnalysis Newsletter January 2021
MuAnalysis Newsletter October 2020
MuAnalysis Newsletter June 2020
MuAnalysis Newsletter January 2020
Video: Recognizing wirebond failures
Video: Recognizing solderability failures
MuAnalysis Newsletter September 2019
Confocal Laser Scanning Microscopy - A Tool for Counterfeit Detection
Estimating the Lifetime of Electrolytic Capacitors
Blackpad Revisited Paper
Aftermarket Electronic Devices
Counterfeit-or-Retrofit
Dynamic-Electroluminescence-Imaging-applied-to-an-OTP
Printed-Circuit-Board-Reliability-Integrity-Characterization
Quantum-Wells-in-Seasonal-Department-Christmas-Lights-LED
Graphene Based Ink Coated Fabrics for Wearable Electronics Analysis
Dynamic-Electroluminescence-Imaging-as-Optical Oscilloscope-Probe